Material and Mechanical Characterization of Multi ...
2019-3-11u2002·u2002Material Characterization Using Scanning Electron Microscopy (SEM) SEM is the most commonly used reliable microscope to characterize the morphologies and dimensions that uses a high vitality electron beam centered to get an interminable number of scattered electron signals from the surface of strong samples and yields a three-dimensional (3D) picture of nanoparticles.
Get Price